2

Complementarity of X-ray diffraction and RBS in thin film characterization

Année:
2005
Langue:
english
Fichier:
PDF, 412 KB
english, 2005
5

Damage in Y-Ba-Cu-O films produced by4He ions

Année:
1994
Langue:
english
Fichier:
PDF, 422 KB
english, 1994